UMA / PRODUCTS / Lens MTF Tester
DSC-E3WG

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DSC-E3WG Wafer Series
Waveguide Image Quality Tester
DSC-E3WG is a sophisticated design system for Waveguide MTF quality measurement.
The DSC-E3WG Wafer design supports both Tray and 8” Wafer test, which also fulfills the demands of mass production.

APPLICATION
Supports both Tray and 8” Wafer test.

FEATURES
✔ DSC-E3WG is capable of measuring waveguide samples in Reflection or Transmission mode.
✔ Support both Tray and 8” Wafer test for mass production.
✔ Support R, G, B Channel MTF test independently, and the light source wavelength can be customized.

 

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FUNCTIONS

MTF 9~17 angular tested by color cameras
Test Channel R、G、B channel
Test Mode Reflection and Transmission mode
Test Positions Within Eye-box Range Changeable
Eye-box Pupil Manual replaceable
Position Centering Position confirmation via vision system (Optional)

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SPECIFICATIONS

Machine Dimensions 900W*1050D*1500H mm
Machine Weight 350 Kg
Power Supply AC220V/10A
Communication Interface I/O Card
Operation System Windows 10 64bit


 
Detector System 9~17 color cameras with telescope lens
Eye-Box Pupil Size 1mm ~ 6mm (Manual replaceable)
Eye Relief +/-5mm (Manual adjustment)
MTF Repeatability Delta MTF (Max-Min) ≤ 3.0
(Condition: 1. The light intensity at each Eyebox position, field and R/G/B channel has to be bright enough(>70/255)
2. The repeatability will be not counted if the brightness is insufficient, which is defined by the system auto-exposure result.)
Average Test Times < 3s/Eye-box position (Eye box position change excluded)
(Condition: The exposure time has to be short enough ( < 500ms )
Test Angular Range
(Multi-Camera)		 Delta (FOV/2) > 6°
Reflection mode(diagonal)   : +/- 30°
Transmission mode(diagonal) : +/- 35°
Max Special Frequency 60lp/deg